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Charge distribution at interface and in bulk of YSZ thin films deposited on Si substrateGMUCOVA, K; HANMANOVIA, M; KUNDRACIK, F et al.Ceramics international. 2006, Vol 32, Num 2, pp 105-109, issn 0272-8842, 5 p.Article

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Fractal perimeters of polishing-induced pull-outs present on polished cross sections of plasma-sprayed yttria-stabilized zirconia coatingsJIANFENG LI; HANLIN LIAO; XIAOYAN WANG et al.Journal of the American Ceramic Society. 2003, Vol 86, Num 11, pp 1906-1910, issn 0002-7820, 5 p.Article

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Determination of niobium diffusion in titania and zirconia using secondary ion mass spectrometrySHEPPARD, L. R; ZHOU, M. F; ATANACIO, A et al.Advances in applied ceramics. 2007, Vol 106, Num 1-2, pp 89-94, 6 p.Article

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Micro-indentation fracture toughness evaluation with a novel microscopyMING CHENG; WEINONG CHEN; JIANPING JIANG et al.Journal of the American Ceramic Society. 2005, Vol 88, Num 6, pp 1666-1668, issn 0002-7820, 3 p.Article

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Sintering kinetics at isothermal shrinkage : II, effect of Y₂O₃ concentration on the initial sintering stage of fine zirconia powderMATSUI, Koji; TANAKA, Kenji; YAMAKAWA, Takanori et al.Journal of the American Ceramic Society. 2007, Vol 90, Num 2, pp 443-447, issn 0002-7820, 5 p.Article

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A novel method for fabrication of Y₂O₃-stabilized ZrO₂ electrolyte filmsYAOHUI ZHANG; XIQIANG HUANG; ZHE LU et al.Journal of the American Ceramic Society. 2006, Vol 89, Num 7, pp 2304-2307, issn 0002-7820, 4 p.Article